Ultra-Low-Voltage Scanning Electron Microscopy In The FEG -SEM
نویسندگان
چکیده
منابع مشابه
Fat uptake evaluation in fried fish fillet by using Scanning Electron Microscopy (SEM)
The aim of this study was to investigate the effects of breading materials and two different frying oils on the fat up-take in the fish fillets during frying process. Breaded and non-breaded black pomfret (Parastromateus niger) fillets were fried in sunflower oil and palm olein. Fat content by Soxhelet method and scanning electron microscopy (SEM) was studied. Results from Soxhelet method showe...
متن کاملFat uptake evaluation in fried fish fillet by using Scanning Electron Microscopy (SEM)
The aim of this study was to investigate the effects of breading materials and two different frying oils on the fat up-take in the fish fillets during frying process. Breaded and non-breaded black pomfret (Parastromateus niger) fillets were fried in sunflower oil and palm olein. Fat content by Soxhelet method and scanning electron microscopy (SEM) was studied. Results from Soxhelet method showe...
متن کاملScanning Electron Microscopy (SEM) analysis and biological control of Ixodes ricinus using entomopathogenic fungi
In the present study, pathogenicity of four native strains of Entomopathogenic fungus; Metarhizium anisopliae, was studied against adult stage of Ixodes ricinus. For this purpose a total number of 180 adult ticks were examined in triplicate. Thirty ticks for each strain and negative and positive controls were immersed in 2.4×107 fungal conidia/ml in vitro. Samples were incubated in separate Pet...
متن کاملNano-Structure Roughening on Poly(Lactic Acid)PLA Substrates: Scanning Electron Microscopy (SEM) Surface Morphology Characterization
Scanningelectron microscopy (SEM) has been utilized to examine the morphology and topography alterations in the surface of Poly(Lactic Acid)(PLA) fabrics due to UV/Ozoneirradiation. In the past decade, a growing attention in the usage of “Green Techniques” in industrial applications has been observed owing to many benefits such as low impurities and their relatively low cost to substitute th...
متن کاملPushing the XEDS Boundaries in Materials Research: Low Voltage XED Spectrum Imaging in the FEG-SEM
Low-voltage high resolution imaging in advanced field emission gun scanning electron microscopes (FEG-SEMs) is an essential technique in the characterisation of a broad range of materials – particularly for polymers and complex multiphase/multicomponent materials, that can experience significant charging effects during conventional 10 to 20 kV imaging. In particular, the analysis of corrosion s...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2002
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927602106167